R&S RTO6 - 18.1.5 Jitter spectrum; 18.2 Advanced jitter and noise (option R&S RTO6- K133;K134); 18.2.1 About jitter

Jitter analysis and clock data recovery
R&S
®
RTO6
1079User Manual 1801.6687.02 ─ 05
Figure 18-3: TIE measurement with CDR trigger, 10 Mbps, with track and histogram
18.1.5 Jitter spectrum
An extension of jitter measurements is the FFT analysis of track waveforms of jitter
measurements. The results are displayed in the frequency domain as a jitter spectrum.
The modulation frequency is displayed on the horizontal axis, and the amplitude of
modulation on the vertical axis. Using FFT
, periodic components can be detected.
18.2
Advanced jitter and noise (option R&S RTO6- K133/
K134)
This chapter describes the settings of the advanced jitter option R&S RTO6- K133 and
of the advanced noise option R&S RTO6- K134.
18.2.1 About jitter
Jitter typically consists of various jitter components that are caused by different jitter
sources, see Figure 18-4.
Advanced jitter and noise (option R&S R
T
O6- K133/K134)