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R&S RTO6 - 8.2.12.1 Statistics

R&S RTO6
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Measurements
R&S
®
RTO6
356User Manual 1801.6687.02 ─ 05
8.2.12.1 Statistics
Statistics can be compiled for each measurement group separately, and also for long-
term measurements. If enabled, statistical results are shown in the result box.
By default, all events in each acquisition are measured and incuded in the statitics: the
measurement result is not only determined once within one acquisition, but repeatedly
,
if available. More results provide a larger basis for statistical evaluation.
T
o obtain precise results, additional measurement settings can be useful:
Reference/signal levels: configuring user-defined levels can compensate for irregu-
lar data, see Chapter 8.2.4, "Reference levels", on page 307.
Gate areas: restricting the waveform range for measurement can eliminate irregu-
lar data, see Chapter 8.2.3, "Measurement gates", on page 304.
Defining a "Signal threshold" for time, area and counting measurements can elimi-
nate noise from the evaluation, see "Signal threshold" on page 322.
Spectrum measurements: you can eliminate noise from the evaluation, see
Threshold and "Peak excursion" on page 295
To enable statistics, use one of the following ways.
Make sure to select the subtab of the measurement group for which you want to
compile statistics.
On the toolbar assist, enable "Statistics".
On the "Setup" tab, enable "Statistics".
If statistics are enabled, the following results are calculated. You can select which
results are shown in the result table, see Chapter 8.2.2.3, "Display settings for results",
on page 303.
Label Description
+Peak Positive peak value (maximum)
-Peak Negative peak value (minimum)
μ (A
vg) A
verage
RMS Root mean square
σ (S-dev) Standard deviation
Event count Number of measured events (e.g. rising edges, pulses etc.)
Wave count Number of waveforms (acquisitions) the measurement is based on
Remote commands:
MEASurement<m>:RESult[:
ACTual]? on page 1487
MEASurement<m>:RESult:AVG? on page 1487
MEASurement<m>:RESult:COUNt? on page 1489
MEASurement<m>:RESult:EVTCount? on page 1487
MEASurement<m>:RESult:NPEak? on page 1487
Automatic measurements

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