Anritsu MS2840A - MEAS:BATC:SEM?

Chapter
４
Native Device Message Details
4-149
4
Native Device Message Details
MEAS:BATC:SEM?
Spectrum Emission Mask Batch Measure
Function
This command executes Spectrum Emission Mask measurement and
outputs the measurement result after the parameters described in the
specified parameter list file have been set.
Query
MEAS:BATC:SEM? n,filename[,device]
Response
The same response as
:MEASure:SEMask[n]?
returns.
Refer to
:MEASure:SEMask[n]?
in “Chapter 2 SCPI Device Message
Details”.
Parameter
n
Measurement Option
Refer to
:MEASure:SEMask[n]?
in “Chapter 2
SCPI Device Message Details”.
filename
Parameter List File
Specify with any character string enclosed by
double quotes (" ") or single quotes (' ')
device
Drive name
A,B,D,E,F,...
D
drive is used when omitted.
Details
Spectrum Emission Mask measurement is executed and the result is
output after the parameters described in the specified parameter list
have been set.
The value returned by this command differs depending on Result Mode.
(cf.
SYST:RES:MODE
)
Place parameter list files in a folder on the specified drive.
<device>:\Anritsu Corporation\Signal Analyzer\User Data\Batch
If the parameter list file has been changed, the changes must be applied
with the
MMEM:REL:BATC
command.
(cf.
MMEM:REL:BATC
)