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Anritsu MS2840A - MEAS:BATC:SPUR?

Anritsu MS2840A
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Chapter
Native Device Message Details
4-151
4
Native Device Message Details
MEAS:BATC:SPUR?
Spurious Emission Batch Measure
Function
This command executes Spurious Emission measurement and outputs
the measurement result after the parameters described in the specified
parameter list file have been set.
Query
MEAS:BATC:SPUR? n,filename[,device]
Response
The same response as
:MEASure:SPURious[n]?
returns.
Refer to
:MEASure:SPURious[n]?
in “Chapter 2 SCPI Device Message
Details”.
Parameter
n
Measurement Option
Refer to
:MEASure:SPURious[n]?
in “Chapter
2 SCPI Device Message Details”.
filename
Parameter List File
Specify with any character string enclosed by 3
sequence (" ") or single quotes (' ')
device
Drive name
A,B,D,E,F,...
D
drive is used when omitted.
Details
SPURious Emission measurement is executed and the result is output
after the parameters described in the specified parameter list have been
set.
The value returned by this command differs depending on Result Mode.
(cf.
SYST:RES:MODE
)
Place parameter list files in a folder on the specified drive.
<device>:\Anritsu Corporation\Signal Analyzer\User Data\Batch
If the parameter list file has been changed, the changes must be applied
with the
MMEM:REL:BATC
command.
(cf.
MMEM:REL:BATC
)

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