Anritsu MS2840A - [:SENSe]:SWEep:EGATe:VIEW:DETector[:FUNCtion]?

Chapter 2 SCPI Device Message Details
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[:SENSe]:SWEep:EGATe:VIEW:DETector[:FUNCtion]?
Gate View Detection Mode Query
Function
This command queries the waveform pattern detection mode for Gate
View.
This parameter and the one for setting the waveform pattern detection
mode for time axis measurement reference the same value.
Query
[:SENSe]:SWEep:EGATe:VIEW:DETector[:FUNCtion]?
Response
<det>
Parameter
<det>
Detection mode
NORM
Simultaneous detection of positive and negative
peaks
POS
Positive peak detection
NEG
Negative peak detection
SAMP
Sample detection
RMS
RMS detection
Example of Use
To query the detection mode.
SWE:EGAT:VIEW:DET?
> POS