Anritsu MS2840A - SEM:OFFS:LIST:SWE:POIN;SEM:OFFS:LIST:SWE:POIN?

Chapter
４
Native Device Message Details
4-246
SEM:OFFS:LIST:SWE:POIN/SEM:OFFS:LIST:SWE:POIN?
Spectrum Emission Mask Offset Trace Point
Function
This command sets the number of the frequency points of the offset for
Spectrum Emission Mask measurement.
Command
SEM:OFFS:LIST:SWE:POIN
integer_1[,integer_2[,integer_3[,integer_4[,integer_5[,i
nteger_6[,integer_7[,integer_8[,integer_9[,integer_10[,i
nteger_11[,integer_12]]]]]]]]]]]
Query
SEM:OFFS:LIST:SWE:POIN?
Response
integer_1,integer_2,integer_3,integer_4,integer_5,intege
r_6,integer_7,integer_8,integer_9,integer_10,integer_11,
integer_12
Parameter
integer_n
Number of frequency points of Offset-n
Range 11 to 30001
Resolution Any of the following values can be selected:
11, 21, 41, 51, 101, 201, 251, 401, 501, 1001,
2001, 5001, 10001, 30001 (MS269xA Only)
Suffix code None
Example of Use
To set the frequency point of the offset.
SEM:OFFS:LIST:SWE:POIN
2001,2001,2001,2001,2001,2001,2001,2001,2001,2001,2001,2
001
SEM:OFFS:LIST:SWE:POIN?
>
2001,2001,2001,2001,2001,2001,2001,2001,2001,2001,2001,2
001