Anritsu MS2840A - READ:SPUR?; RES?

Chapter
４
Native Device Message Details
4-193
4
Native Device Message Details
READ:SPUR?
Spurious Emission Read
Function
This command performs the Spurious Emission measurement and
queries the result.
It works in the same way as the two commands are transmitted in the
following order:
INIT:SPUR
FETC:SPUR?
Query
READ:SPUR? n
RES?
Measure Result Query
Function
This command queries the measurement results of the Measure function.
Query
RES?
RES? Mode
(in ACP measurement)
Response and Parameter
Both of them vary according to the measurement item. For details, refer
to the following pages.
Details
*** is returned when measurement is not performed normally.
Example of Use
To query ACP measurement results.
RES?
>1.234,1.234,1.234,1.234,1.234,1.234,1.234,1.234,1.234,1
.234,1.234,1.234,1.234