Anritsu MS2840A - [:SENSe]:SEMask:OFFSet[1]:LIST:SWEep[1]:POINts <integer_1>[,<integer_2>[,<integer_3>[,<integer_4>[,<integer_5>[,<integer_6>[,<integer_7>[,<integer_8>[,<integer_9>[,<integer_10>[,<integer_11>[,<integer_12>]]]]]]]]]]]

2.13 Spectrum Emission Mask
2-639
2
SCPI Device Message Details
[:SENSe]:SEMask:OFFSet[1]:LIST:SWEep[1]:POINts
<integer_1>[,<integer_2>[,<integer_3>[,<integer_4>[,<integer_5>[,<integer_6
>[,<integer_7>[,<integer_8>[,<integer_9>[,<integer_10>[,<integer_11>[,<integ
er_12>]]]]]]]]]]]
Spectrum Emission Mask Offset Trace Point
Function
This command queries the number of frequency display points of the
offset for Spectrum Emission Mask measurement.
Command
[:SENSe]:SEMask:OFFSet[1]:LIST:SWEep[1]:POINts
<integer_n>
Parameter
<integer_n>
Number of frequency display points of Offset-n
Range 11 to 10001
Resolution Any of the following values can be selected:
11, 21, 41, 51, 101, 201, 251, 401, 501, 1001,
2001, 5001, 10001, 30001 (MS269xA Only)
Suffix code None
Example of Use
To set the number of frequency display points of the offset.
SEM:OFFS:LIST:SWE:POIN
2001,2001,2001,2001,2001,2001,2001,2001,2001,2001,2001,2
001