Anritsu MS2840A - SEM:LOG:OFFS:LIST:TEST;SEM:LOG:OFFS:LIST:TEST?

Chapter
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Native Device Message Details
4-225
4
Native Device Message Details
SEM:LOG:OFFS:LIST:TEST/SEM:LOG:OFFS:LIST:TEST?
Spectrum Emission Mask Fail Logic
Function
This command selects the judgment method of the offset for Spectrum
Emission Mask measurement.
Command
SEM:LOG:OFFS:LIST:TEST
logic_1[,logic_2[,logic_3[,logic_4[,logic_5[,logic_6[,lo
gic_7[,logic_8[,logic_9[,logic_10[,logic_11[,logic_12]]]
]]]]]]]]
Query
SEM:LOG:OFFS:LIST:TEST?
Response
logic_1,logic_2,logic_3,logic_4,logic_5,logic_6,logic_7,
logic_8,logic_9,logic_10,logic_11,logic_12
Parameter
logic_n
Judgment method for offset n
OFF
Not judge.
ABS
ABS1
Judges using the absolute level upper limit 1.
REL
REL
Judges using the relative level upper limit.
AND
ABS1 and REL
Judges “AND” using the absolute level upper
limit 1 and relative level upper limit.
OR
ABS1 or REL
Judges “OR” using the absolute level upper limit
1 and relative level upper limit.
AAND
(ABS1 and REL) and ABS2
Judges “AND” using the absolute level upper
limit 1 and relative level upper limit. Judges
“AND” using the result and the absolute level
upper limit 2.
AOR
(ABS1 or REL) and ABS2
Judges “OR” using the absolute level upper limit
1 and relative level upper limit. Judges “AND”
using the result and the absolute level upper
limit 2.