Anritsu MS2840A - SWE:EGAT:VIEW:DET;SWE:EGAT:VIEW:DET?

Chapter
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Native Device Message Details
4-328
SWE:EGAT:VIEW:DET/SWE:EGAT:VIEW:DET?
Gate View Detection Mode
Function
This command selects the waveform pattern detection mode for Gate
View.
This parameter and the one for setting the waveform pattern detection
mode for time axis measurement reference the same value.
Command
SWE:EGAT:VIEW:DET det
Query
SWE:EGAT:VIEW:DET?
Response
det
Parameter
det
Detection mode
NORM
Simultaneous detection of positive and negative
peaks
POS
Positive peak detection
NEG
Negative peak detection
SAMP
Sample detection
RMS
RMS detection
Details
This command is not available when Gate View is set to Off.
Example of Use
To set the detection mode to positive peak detection.
SWE:EGAT:VIEW:DET POS
SWE:EGAT:VIEW:DET?
> POS