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Anritsu MS2840A - Page 829

Anritsu MS2840A
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2.14 Spurious Emission Measurement Function
2-819
2
SCPI Device Message Details
spurious noise generated within the unit.
Refer to the mainframe Operation Manual (Operation) for details about
spurious noise generation and appropriate conditions for using the Low
Phase Noise Function.
Example of Use
To query the On/Off state of Low Phase Noise function during Spurious
Emission measurement.
SPUR:SYNT:LPH?
> 1

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