Reset Generation Module (MC_RGM) RM0046
194/936 Doc ID 16912 Rev 5
Destructive Event Status Register (RGM_DES)
This register contains the status of the last asserted destructive reset sources. It can be
accessed in read/write on either supervisor mode or test mode. Register bits are cleared on
write ‘1’.
F_CORE
Flag for core reset
0 No core reset event has occurred since either the last clear or the last destructive reset assertion
1 A core reset event has occurred
F_JTAG
Flag for JTAG initiated reset
0 No JTAG initiated reset event has occurred since either the last clear or the last destructive reset
assertion
1 A JTAG initiated reset event has occurred
Table 58. Functional Event Status Register (RGM_FES) Field Descriptions (continued)
Field Description
Figure 70. Destructive Event Status Register (RGM_DES)
Address 0xC3FE_4002 Access: User read, Supervisor read/write, Test read/write
0123456789101112131415
R
F_POR
00000000
F_LVD27_IO
F_LVD27_FLASH
F_LVD27_VREG
0
F_SWT
0
F_LVD12
Ww1c w1c w1c w1c w1c w1c
POR1000000000000000
Table 59. Destructive Event Status Register (RGM_DES) Field Descriptions
Field Description
F_POR
Flag for Power-On reset
0 No power-on event has occurred since the last clear
1 A power-on event has occurred
F_LVD27_IO
Flag for 2.7V low-voltage detected (I/O)
0 No 2.7V low-voltage detected (I/O) event has occurred since either the last clear or the last
power-on reset assertion
1 A 2.7V low-voltage detected (I/O) event has occurred
F_LVD27_FLASH
Flag for 2.7V low-voltage detected (flash)
0 No 2.7V low-voltage detected (flash) event has occurred since either the last clear or the last
power-on reset assertion
1 A 2.7V low-voltage detected (flash) event has occurred