27.5 JTAG and Boundary Scan
Table 27-12. JTAG Characteristics
UnitMaxNomMinParameter NameParameterParameter
No.
MHz10-0TCK operational clock frequency
a
F
TCK
J1
ns--100TCK operational clock periodT
TCK
J2
ns-t
TCK
/2-TCK clock Low timeT
TCK_LOW
J3
ns-t
TCK
/2-TCK clock High timeT
TCK_HIGH
J4
ns10-0TCK rise timeT
TCK_R
J5
ns10-0TCK fall timeT
TCK_F
J6
ns--8TMS setup time to TCK riseT
TMS_SU
J7
ns--4TMS hold time from TCK riseT
TMS_HLD
J8
ns--18TDI setup time to TCK riseT
TDI_SU
J9
ns--4TDI hold time from TCK riseT
TDI_HLD
J10
ns3513
-
TCK fall to Data Valid from High-Z, 2-mA drive
T
TDO_ZDV
J11
ns269TCK fall to Data Valid from High-Z, 4-mA drive
ns268TCK fall to Data Valid from High-Z, 8-mA drive
ns2910TCK fall to Data Valid from High-Z, 8-mA drive with
slew rate control
ns1311TCK fall to Data Valid from High-Z, 10-mA drive
ns1411TCK fall to Data Valid from High-Z, 12-mA drive
ns2014
-
TCK fall to Data Valid from Data Valid, 2-mA drive
T
TDO_DV
J12
ns2610TCK fall to Data Valid from Data Valid, 4-mA drive
ns218TCK fall to Data Valid from Data Valid, 8-mA drive
ns2610TCK fall to Data Valid from Data Valid, 8-mA drive
with slew rate control
ns1412TCK fall to Data Valid from Data Valid, 10-mA drive
ns1512TCK fall to Data Valid from Data Valid, 12-mA drive
ns167
-
TCK fall to High-Z from Data Valid, 2-mA drive
T
TDO_DVZ
J13
ns167TCK fall to High-Z from Data Valid, 4-mA drive
ns167TCK fall to High-Z from Data Valid, 8-mA drive
ns198TCK fall to High-Z from Data Valid, 8-mA drive with
slew rate control
ns2220TCK fall to High-Z from Data Valid, 10-mA drive
ns2520TCK fall to High-Z from Data Valid, 12-mA drive
a. A ratio of at least 8:1 must be kept between the system clock and TCK.
June 18, 20141824
Texas Instruments-Production Data
Electrical Characteristics