EasyManuals Logo
Home>Texas Instruments>Microcontrollers>TM4C1294NCPDT

Texas Instruments TM4C1294NCPDT User Manual

Texas Instruments TM4C1294NCPDT
1890 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Page #78 background imageLoading...
Page #78 background image
Compare a test voltage against any one of the following voltages:
An individual external reference voltage
A shared single external reference voltage
A shared internal reference voltage
1.3.9 JTAG and ARM Serial Wire Debug (see page 207)
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a Test Access Port and
Boundary Scan Architecture for digital integrated circuits and provides a standardized serial interface
for controlling the associated test logic. The TAP, Instruction Register (IR), and Data Registers (DR)
can be used to test the interconnections of assembled printed circuit boards and obtain manufacturing
information on the components. The JTAG Port also provides a means of accessing and controlling
design-for-test features such as I/O pin observation and control, scan testing, and debugging. Texas
Instruments replaces the ARM SW-DP and JTAG-DP with the ARM Serial Wire JTAG Debug Port
(SWJ-DP) interface. The SWJ-DP interface combines the SWD and JTAG debug ports into one
module providing all the normal JTAG debug and test functionality plus real-time access to system
memory without halting the core or requiring any target resident code. The SWJ-DP interface has
the following features:
IEEE 1149.1-1990 compatible Test Access Port (TAP) controller
Four-bit Instruction Register (IR) chain for storing JTAG instructions
IEEE standard instructions: BYPASS, IDCODE, SAMPLE/PRELOAD, and EXTEST
ARM additional instructions: APACC, DPACC and ABORT
Integrated ARM Serial Wire Debug (SWD)
Serial Wire JTAG Debug Port (SWJ-DP)
Flash Patch and Breakpoint (FPB) unit for implementing breakpoints
Data Watchpoint and Trace (DWT) unit for implementing watchpoints, trigger resources, and
system profiling
Instrumentation Trace Macrocell (ITM) for support of printf style debugging
Embedded Trace Macrocell (ETM) for instruction trace capture
Trace Port Interface Unit (TPIU) for bridging to a Trace Port Analyzer
1.3.10 Packaging and Temperature
128-pin RoHS-compliant TQFP package
Industrial (-40°C to 85°C) ambient temperature range
Extended (-40°C to 105°C) ambient temperature range
1.4 TM4C1294NCPDT Microcontroller Hardware Details
Details on the pins and package can be found in the following sections:
June 18, 201478
Texas Instruments-Production Data
Architectural Overview

Table of Contents

Questions and Answers:

Question and Answer IconNeed help?

Do you have a question about the Texas Instruments TM4C1294NCPDT and is the answer not in the manual?

Texas Instruments TM4C1294NCPDT Specifications

General IconGeneral
BrandTexas Instruments
ModelTM4C1294NCPDT
CategoryMicrocontrollers
LanguageEnglish

Related product manuals