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Texas Instruments AFE79 Series - 2.4.156 Register C4 h (offset = C4 h) [reset = 0 h]; 2.4.157 Register C5 h (offset = C5 h) [reset = 0 h]; 2.4.158 Register C6 h (offset = C6 h) [reset = 0 h]

Texas Instruments AFE79 Series
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DAC JESD Register Map
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320
SBAU337May 2020
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Copyright © 2020, Texas Instruments Incorporated
Serial Interface Register Maps
Table 2-388. Register C3 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT5[15:8]
R/W 0h short test pattern input
2.4.156 Register C4h (offset = C4h) [reset = 0h]
Figure 2-385. Register C4h
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT6[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-389. Register C4 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT6[7:0]
R/W 0h short test pattern input
2.4.157 Register C5h (offset = C5h) [reset = 0h]
Figure 2-386. Register C5h
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT6[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-390. Register C5 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT6[15:8]
R/W 0h short test pattern input
2.4.158 Register C6h (offset = C6h) [reset = 0h]
Figure 2-387. Register C6h
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT7[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-391. Register C6 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT7[7:0]
R/W 0h short test pattern input

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