Texas Instruments AFE79 Series User Manual

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453
SBAU337–May 2020
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Serial Interface Register Maps
2.5.199 Register 119h (offset = 119h) [reset = 0h]
Figure 2-695. Register 119h
7 6 5 4 3 2 1 0
JESD_SHORT_TEST_PATTERN_INPUT6[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-700. Register 119 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORT_TE
ST_PATTERN_INP
UT6[15:8]
R/W 0h
Used when jesd_short_test_pattern_override or
fb_jesd_short_test_pattern_override are set
ADC sample6
2.5.200 Register 11Ah (offset = 11Ah) [reset = 0h]
Figure 2-696. Register 11Ah
7 6 5 4 3 2 1 0
JESD_SHORT_TEST_PATTERN_INPUT7[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-701. Register 11A Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORT_TE
ST_PATTERN_INP
UT7[7:0]
R/W 0h
Used when jesd_short_test_pattern_override or
fb_jesd_short_test_pattern_override are set
ADC sample7
2.5.201 Register 11Bh (offset = 11Bh) [reset = 0h]
Figure 2-697. Register 11Bh
7 6 5 4 3 2 1 0
JESD_SHORT_TEST_PATTERN_INPUT7[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-702. Register 11B Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORT_TE
ST_PATTERN_INP
UT7[15:8]
R/W 0h
Used when jesd_short_test_pattern_override or
fb_jesd_short_test_pattern_override are set
ADC sample7
2.5.202 Register 11Ch (offset = 11Ch) [reset = 0h]
Figure 2-698. Register 11Ch
7 6 5 4 3 2 1 0
0 0 CTRL_FB_MAPPER_CLK_GATI
NG
CTRL_RX2_MAPPER_CLK_GA
TING
CTRL_RX1_MAPPER_CLK_GA
TING
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset

Texas Instruments AFE79 Series Specifications

General

Brand	Texas Instruments
Model	AFE79 Series
Category	Control Unit
Language	English