Texas Instruments AFE79 Series - 2.4.170 Register D2 h (offset = D2 h) [reset = 0 h]; 2.4.171 Register D3 h (offset = D3 h) [reset = 0 h]; 2.4.172 Register D4 h (offset = D4 h) [reset = 0 h]

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SBAU337–May 2020
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Serial Interface Register Maps
Table 2-402. Register D1 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT12[15:8]
R/W 0h short test pattern input
2.4.170 Register D2h (offset = D2h) [reset = 0h]
Figure 2-399. Register D2h
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT13[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-403. Register D2 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT13[7:0]
R/W 0h short test pattern input
2.4.171 Register D3h (offset = D3h) [reset = 0h]
Figure 2-400. Register D3h
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT13[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-404. Register D3 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT13[15:8]
R/W 0h short test pattern input
2.4.172 Register D4h (offset = D4h) [reset = 0h]
Figure 2-401. Register D4h
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT14[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-405. Register D4 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT14[7:0]
R/W 0h short test pattern input