Texas Instruments AFE79 Series - 2.4.163 Register CBh (offset = CBh) [reset = 0 h]; 2.4.164 Register CCh (offset = CCh) [reset = 0 h]; 2.4.165 Register CDh (offset = CDh) [reset = 0 h]

DAC JESD Register Map www.ti.com
322
SBAU337–May 2020
Submit Documentation Feedback
Copyright © 2020, Texas Instruments Incorporated
Serial Interface Register Maps
Table 2-395. Register CA Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT9[7:0]
R/W 0h short test pattern input
2.4.163 Register CBh (offset = CBh) [reset = 0h]
Figure 2-392. Register CBh
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT9[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-396. Register CB Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT9[15:8]
R/W 0h short test pattern input
2.4.164 Register CCh (offset = CCh) [reset = 0h]
Figure 2-393. Register CCh
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT10[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-397. Register CC Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT10[7:0]
R/W 0h short test pattern input
2.4.165 Register CDh (offset = CDh) [reset = 0h]
Figure 2-394. Register CDh
7 6 5 4 3 2 1 0
JESD_SHORTTEST_INPUT10[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-398. Register CD Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORTTES
T_INPUT10[15:8]
R/W 0h short test pattern input