Texas Instruments AFE79 Series - 2.5.189 Register 10 Fh (offset = 10 Fh) [reset = 0 h]; 2.5.190 Register 110 h (offset = 110 h) [reset = 0 h]; 2.5.191 Register 111 h (offset = 111 h) [reset = 0 h]

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SBAU337–May 2020
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Serial Interface Register Maps
Table 2-689. Register 10E Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORT_TE
ST_PATTERN_INP
UT1[7:0]
R/W 0h
Used when jesd_short_test_pattern_override or
fb_jesd_short_test_pattern_override are set
ADC sample1
2.5.189 Register 10Fh (offset = 10Fh) [reset = 0h]
Figure 2-685. Register 10Fh
7 6 5 4 3 2 1 0
JESD_SHORT_TEST_PATTERN_INPUT1[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-690. Register 10F Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORT_TE
ST_PATTERN_INP
UT1[15:8]
R/W 0h
Used when jesd_short_test_pattern_override or
fb_jesd_short_test_pattern_override are set
ADC sample1
2.5.190 Register 110h (offset = 110h) [reset = 0h]
Figure 2-686. Register 110h
7 6 5 4 3 2 1 0
JESD_SHORT_TEST_PATTERN_INPUT2[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-691. Register 110 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORT_TE
ST_PATTERN_INP
UT2[7:0]
R/W 0h
Used when jesd_short_test_pattern_override or
fb_jesd_short_test_pattern_override are set
ADC sample2
2.5.191 Register 111h (offset = 111h) [reset = 0h]
Figure 2-687. Register 111h
7 6 5 4 3 2 1 0
JESD_SHORT_TEST_PATTERN_INPUT2[15:8]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-692. Register 111 Field Descriptions
Bit Field Type Reset Description
7-0
JESD_SHORT_TE
ST_PATTERN_INP
UT2[15:8]
R/W 0h
Used when jesd_short_test_pattern_override or
fb_jesd_short_test_pattern_override are set
ADC sample2