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Texas Instruments AFE79 Series User Manual

Texas Instruments AFE79 Series
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SERDES Register Map
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470
SBAU337May 2020
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Copyright © 2020, Texas Instruments Incorporated
Serial Interface Register Maps
2.6.9 Register 4008h (offset = 4008h) [reset = 0h]
Figure 2-723. Register 4008h
7 6 5 4 3 2 1 0
RX_SD_CROSSOVER_COUNT[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-729. Register 4008 Field Descriptions
Bit Field Type Reset Description
7-0
RX_SD_CROSSO
VER_COUNT[7:0]
R/W 0h
The count of the number of times the incoming signal must
cross the signal detect threshold level within the signal
detection window.
2.6.10 Register 4009h (offset = 4009h) [reset = 7Ah]
Figure 2-724. Register 4009h
7 6 5 4 3 2 1 0
RX_SD_CLOCK_CYCLES RX_SD_CROSSOVER_COUNT[11:8]
R/W-7h R/W-Ah
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-730. Register 4009 Field Descriptions
Bit Field Type Reset Description
7-4
RX_SD_CLOCK_C
YCLES
R/W 7h
Number of clock cycles that defines the signal detection
window. The period is defined as 2^(N+6) UI, where N is a 4-
bit value. Zero is not valid for N.
3-0
RX_SD_CROSSO
VER_COUNT[11:8]
R/W Ah
The count of the number of times the incoming signal must
cross the signal detect threshold level within the signal
detection window.
2.6.11 Register 400Eh (offset = 400Eh) [reset = 12h]
Figure 2-725. Register 400Eh
7 6 5 4 3 2 1 0
EM_DEPTH
R/W-9h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-731. Register 400E Field Descriptions
Bit Field Type Reset Description
4-1 EM_DEPTH R/W 9h
The timer for eye margin measurement. This decides the
window for eye measurement in 4^(m-1) machine cycles.
2.6.12 Register 4010h (offset = 4010h) [reset = 8h]
Figure 2-726. Register 4010h
7 6 5 4 3 2 1 0
DFE_INIT_2[0] DFE_INIT_3
R/W-0h R/W-8h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset

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Texas Instruments AFE79 Series Specifications

General IconGeneral
BrandTexas Instruments
ModelAFE79 Series
CategoryControl Unit
LanguageEnglish

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